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OmniScan X3 Series

EVIDENT

OmniScan X3 Series

Each OmniScan™ X3 series defect detector represents a complete phased array instrument. Innovative TFM and advanced PA capabilities facilitate reliable defect identification while powerful software tools and simplified workflows improve productivity.

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01
Dimensions (Width × Height × Depth)
335 mm × 221 mm × 151 mm
02
Weight
5.7 kg (with 1 battery)
03
Internal memory
64 GB SSD internal memory, expandable via an external USB key as needed
04
Storage media
SDHC™ and SDXC™ cards or standard USB storage media
05
GPS
Yes (unless specified otherwise in some areas)
06
Alarms
3
07
Wireless connection
Yes (USB holder sold separately as an accessory)
08
Connectors
1 PA connector, 2 UT channels (2 P/R connectors each)
09
Number of groups
8 groups (16:128PR and 32:128PR); 16:64PR offers 2 groups (PA, UT or TFM) or 2PA + 1UT
10
Certification
ISO 18563-1:2015 EN12668-1:2010

Highlights

Why choose OmniScan X3 Series?

01

Portable power

The OmniScan X3 combines rugged, portable construction with advanced performance, delivering high-power focusing capabilities. The OmniScan Thanks to this optimized performance, complex inspections can be performed on materials of high thickness or attenuation, expanding the possibilities for developing new inspection procedures for a wider range of applications.

02

Visible reliability

The OmniScan X3 flaw detector is a complete phased array instrument, designed to ensure reliable and precise inspections. The integration of advanced features, such as Total Focusing Method (TFM) imaging and advanced visualization, ensures high image quality, allowing you to complete every inspection with greater confidence and precision.

03

Instant confirmation of TFM beam coverage

The Acoustic Influence Mapping (AIM) tool offers an at-a-glance visual model of beam sensitivity, based on the selected mode, configuration and simulated reflector. Thanks to AIM, it is possible to eliminate the subjective element in the creation of the scan plane, viewing the effect of the waves in real time in TFM mode. This allows you to identify sensitivity limits and adjust the scanning plane optimally, improving the reliability and effectiveness of inspections.

01

Portable power

The OmniScan X3 combines rugged, portable construction with advanced performance, delivering high-power focusing capabilities. The OmniScan Thanks to this optimized performance, complex inspections can be performed on materials of high thickness or attenuation, expanding the possibilities for developing new inspection procedures for a wider range of applications.

02

Visible reliability

The OmniScan X3 flaw detector is a complete phased array instrument, designed to ensure reliable and precise inspections. The integration of advanced features, such as Total Focusing Method (TFM) imaging and advanced visualization, ensures high image quality, allowing you to complete every inspection with greater confidence and precision.

03

Instant confirmation of TFM beam coverage

The Acoustic Influence Mapping (AIM) tool offers an at-a-glance visual model of beam sensitivity, based on the selected mode, configuration and simulated reflector. Thanks to AIM, it is possible to eliminate the subjective element in the creation of the scan plane, viewing the effect of the waves in real time in TFM mode. This allows you to identify sensitivity limits and adjust the scanning plane optimally, improving the reliability and effectiveness of inspections.