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OmniScan ECA/ECT

OmniScan ECA/ECT

The OmniScan® MX defect detector offers an advanced solution for nondestructive testing (NDT) inspections, combining high resolution, color representation, and an intuitive interface in a portable format. The large, highly readable display enables clear and immediate analysis. Inspections are simplified with Eddy Current Array (ECA) technology, which is an innovative alternative to traditional NDT inspection methods. The system offers advanced storage and analysis capabilities and reliable inspection of composite materials with C-Scan representation.

01
Dimensions (Width × Height × Depth)
321 mm × 209 mm × 125 mm
02
Weight
4.6 kg including the module and a battery
03
Display
Display TFT LCD, 21 cm, 800 pixel × 600 pixel e 16 millions of colors
04
Feed
Smart lithium ion batteries (up to 2) and DC voltage from 15V to 18V (min. 50W)
05
Battery life
6 hours minimum, with two batteries of 3 hours minimum per battery, under normal use conditions
06
Data storage
Compact flash card
07
Ports I/O
3 USB ports
08
Operating temperature
0°C to 40°C; 0 °C to 35 oC with 32:128 PA
09
Storage temperature
–20°C to 70°C; relative humidity 0% to 95% non-condensing; without ventilation; Splash water resistant structure

Why choose OmniScan ECA/ECT?

01

Reliability and robustness

With thousands of units operating worldwide, OmniScan® MX is designed for reliability and endurance even in harsh environmental conditions. The device is compact and lightweight, ideal for use in the field, and ensures autonomy of up to six hours thanks to lithium ion batteries. The 213 mm color display is visible in any light condition, while the simple and intuitive interface can be navigated via rotary knob or USB mouse for easier inspection analysis.

02

Three technologies in a single tool

OmniScan® MX1 supports three advanced methodologies to adapt to every inspection need. Eddy Current Technology (ECT) enables the detection of defects under thin coatings. Eddy Current Array (ECA) technology allows for faster scanning and wide coverage. The control of composite materials is made more effective thanks to optimized software that simplifies the transition between the different analysis modes.

03

Fast scans and greater coverage

Eddy Current Array (ECA) technology integrates multiple bridging and reflection coils to cover a larger area for each inspection scan. Each ECA probe model is designed to ensure a high probability of detecting specific defects along the entire length of the probe. With OmniScan® MX ECA you can perform manual inspections at high speed, obtaining efficient results with color representation and advanced archiving functionality.

04

Power and simplicity with the MXE 03 software

OmniScan® MXE 3.0 ECA software is designed to provide an intuitive interface and easy transition from traditional ECT instruments, such as the Olympus NORTEC 600. The system ensures easy calibration for quick setups and greater accessibility to advanced ECA features, enabling advanced defect analysis with high-resolution color images.

05

Inspection through thin coatings

Thanks to Eddy Current Technology (ECT), defects can be detected even under thin coatings such as paint, with thicknesses between 0.5 mm and 2.0 mm. The combination of ECA and ECT guarantees wide coverage and fast scanning, ensuring a high probability of defect detection and color image representation for more detailed analysis. OmniScan® MX with ECA/ECT represents the evolution of non-destructive inspection technology, with uncompromising reliability.

01

Reliability and robustness

With thousands of units operating worldwide, OmniScan® MX is designed for reliability and endurance even in harsh environmental conditions. The device is compact and lightweight, ideal for use in the field, and ensures autonomy of up to six hours thanks to lithium ion batteries. The 213 mm color display is visible in any light condition, while the simple and intuitive interface can be navigated via rotary knob or USB mouse for easier inspection analysis.

02

Three technologies in a single tool

OmniScan® MX1 supports three advanced methodologies to adapt to every inspection need. Eddy Current Technology (ECT) enables the detection of defects under thin coatings. Eddy Current Array (ECA) technology allows for faster scanning and wide coverage. The control of composite materials is made more effective thanks to optimized software that simplifies the transition between the different analysis modes.

03

Fast scans and greater coverage

Eddy Current Array (ECA) technology integrates multiple bridging and reflection coils to cover a larger area for each inspection scan. Each ECA probe model is designed to ensure a high probability of detecting specific defects along the entire length of the probe. With OmniScan® MX ECA you can perform manual inspections at high speed, obtaining efficient results with color representation and advanced archiving functionality.

04

Power and simplicity with the MXE 03 software

OmniScan® MXE 3.0 ECA software is designed to provide an intuitive interface and easy transition from traditional ECT instruments, such as the Olympus NORTEC 600. The system ensures easy calibration for quick setups and greater accessibility to advanced ECA features, enabling advanced defect analysis with high-resolution color images.

05

Inspection through thin coatings

Thanks to Eddy Current Technology (ECT), defects can be detected even under thin coatings such as paint, with thicknesses between 0.5 mm and 2.0 mm. The combination of ECA and ECT guarantees wide coverage and fast scanning, ensuring a high probability of defect detection and color image representation for more detailed analysis. OmniScan® MX with ECA/ECT represents the evolution of non-destructive inspection technology, with uncompromising reliability.